Programm
| 09.00 Uhr | Registrierung und Eröffnung der Industrieausstellung - mit Kaffee |
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| 09.30 Uhr | Begrüssung und Moderation |
D. Martini / Dr. U. Drehsen |
| 09.40 Uhr | Ökonomische und ökologische Prozesse in der Instrumentenaufbereitung - Ein Blick in die Zukunft - | Dr. R. Simmoteit |
| 10.20 Uhr | Automation in der AEMP |
G. Heller |
| 11.00 Uhr |
Kaffee-Pause |
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| 11.30 Uhr | Inklusion von Gehörlosen in der AEMP |
C. Meijer |
| 12.10 Uhr | Standardisierung der MIC-Aufbereitung |
V. Rhein |
| 13.00 Uhr | Mittagspause und Besuch der Industrieausstellung |
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| 14.00 Uhr | Wer hat an der Uhr gedreht? Arbeitszeitmodelle für die Zukunft in der AEMP |
R. Stens |
| 15.00 Uhr | Funktionskontrolle chirurgischer Instrumente |
V. Kalinitschenko |
| 15.45 Uhr | Abschluss und Ausklang der Veranstaltung - Ausgabe von Teilnehmerzertifikaten Ende der Veranstaltung ca. 16.00 Uhr |
Ton van den Broek
Technical Supply Chain Engineer
ThermoFisher Scientific
After completing a professional bachelor's degree in mechanical engineering, I started my career at Philips CFT. One year later I moved to Philips Electron Optics (later FEI and then ThermoFisher Scientific), working as a system engineer, field service engineer, troubleshooter and product engineer. As a product engineer I was responsible for the cleanliness and vacuum of the accelerator. Currently I serve as Technical Supply Chain Engineer, responsible for the worldwide supply chain of TEM components.
Technical Presentation
Contamination Control in the ThermoFisher supply chain for Electron Microscopy
ThermoFisher Scientific electron microscopes require a very high cleanliness level to achieve optimal performance, especially the parts and modules in contact with vacuum environments (HV and UHV/XHV), high energetic light (electron beam) and high tension. Cleanliness throughout the manufacturing, cleaning, and assembly process of components plays a critical role in the result of the system. This presentation will highlight the key aspects of manufacturing, as well as the required specifications and validations. Practical examples will be discussed.